Gregory Munson Yeric

1993
2	EE	C. Patrick Yue, Victor Martin Agostinelli Jr., Gregory Munson Yeric, A. F. Tasch Jr.: Improved universal MOSFET electron mobility degradation models for circuit simulation. IEEE Trans. on CAD of Integrated Circuits and Systems 12(10): 1542-1546 (1993)
1990
1	EE	Gregory Munson Yeric, A. F. Tasch Jr., Sanjay K. Banerjee: A universal MOSFET mobility degradation model for circuit simulation. IEEE Trans. on CAD of Integrated Circuits and Systems 9(10): 1123-1126 (1990)

Coauthor Index

1	Victor Martin Agostinelli Jr.	[2]
2	Sanjay K. Banerjee	[1]
3	A. F. Tasch Jr.	[1] [2]
4	C. Patrick Yue	[2]