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1990 | ||
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1 | EE | Gregory Munson Yeric, A. F. Tasch Jr., Sanjay K. Banerjee: A universal MOSFET mobility degradation model for circuit simulation. IEEE Trans. on CAD of Integrated Circuits and Systems 9(10): 1123-1126 (1990) |
1 | A. F. Tasch Jr. | [1] |
2 | Gregory Munson Yeric | [1] |