| |
| 2005 | ||
|---|---|---|
| 1 | EE | Joachim Sudbrock, Jaan Raik, Raimund Ubar, Wieslaw Kuzmicz, Witold A. Pleskacz: Defect-Oriented Test- and Layout-Generation for Standard-Cell ASIC Designs. DSD 2005: 79-82 |
| 1 | Wieslaw Kuzmicz | [1] |
| 2 | Witold A. Pleskacz | [1] |
| 3 | Jaan Raik | [1] |
| 4 | Raimund Ubar | [1] |