| |
| 2008 | ||
|---|---|---|
| 5 | EE | Thomas Ordas, Mathieu Lisart, Etienne Sicard, Philippe Maurine, Lionel Torres: Near-Field Mapping System to Scan in Time Domain the Magnetic Emissions of Integrated Circuits. PATMOS 2008: 229-236 |
| 2005 | ||
| 4 | EE | Etienne Sicard, J. M. Dienot: Issues in electromagnetic compatibility of integrated circuits: emission and susceptibility. Microelectronics Reliability 45(9-11): 1277-1284 (2005) |
| 2004 | ||
| 3 | EE | Etienne Sicard: Electromagnetic compatibility of integrated circuits. Microelectronics Journal 35(6): 485-486 (2004) |
| 2 | EE | C. Lochot, S. Calvet, S. Ben Dhia, Etienne Sicard: REGINA test mask: research on EMC guidelines for integrated automotive circuits. Microelectronics Journal 35(6): 509-523 (2004) |
| 1999 | ||
| 1 | EE | Etienne Sicard, Chen Xi: A PC-based Educational Tool for CMOS Integrated Circuit Design. MSE 1999: 47-48 |
| 1 | S. Calvet | [2] |
| 2 | S. Ben Dhia | [2] |
| 3 | J. M. Dienot | [4] |
| 4 | Mathieu Lisart | [5] |
| 5 | C. Lochot | [2] |
| 6 | Philippe Maurine | [5] |
| 7 | Thomas Ordas | [5] |
| 8 | Lionel Torres | [5] |
| 9 | Chen Xi | [1] |