J. M. Dienot
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2005
1
EE
Etienne Sicard
, J. M. Dienot: Issues in electromagnetic compatibility of integrated circuits: emission and susceptibility.
Microelectronics Reliability 45
(9-11): 1277-1284 (2005)
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1
Etienne Sicard
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
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