| |
| 2006 | ||
|---|---|---|
| 1 | EE | K. Hayama, K. Takakura, K. Shigaki, H. Ohyama, J. M. Rafí, A. Mercha, E. Simoen, C. Claeys: Impact on the back gate degradation in partially depleted SOI n-MOSFETs by 2-MeV electron irradiation. Microelectronics Reliability 46(9-11): 1731-1735 (2006) |
| 1 | C. Claeys | [1] |
| 2 | K. Hayama | [1] |
| 3 | A. Mercha | [1] |
| 4 | H. Ohyama | [1] |
| 5 | J. M. Rafí | [1] |
| 6 | E. Simoen | [1] |
| 7 | K. Takakura | [1] |