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K. Shigaki

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2006
1EEK. Hayama, K. Takakura, K. Shigaki, H. Ohyama, J. M. Rafí, A. Mercha, E. Simoen, C. Claeys: Impact on the back gate degradation in partially depleted SOI n-MOSFETs by 2-MeV electron irradiation. Microelectronics Reliability 46(9-11): 1731-1735 (2006)

Coauthor Index

1C. Claeys [1]
2K. Hayama [1]
3A. Mercha [1]
4H. Ohyama [1]
5J. M. Rafí [1]
6E. Simoen [1]
7K. Takakura [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)