Julie D. Segal

2003
3	EE	Israel Koren, Julie D. Segal: Optimizing the Yield of VLSI Circuits. ISQED 2003: 7
1999
2	EE	Julie D. Segal, Sergei Bakarian, Ron Ross: Impact of Simulation Parameters on Critical Area Analysis. DFT 1999: 14-
1	EE	Julie D. Segal, Sergei Bakarian, Jonathon E. Colburn, Madan Kumar, Chang Hong, Alex Shubat: Determining Redundancy Requirements for Memory Arrays with Critical Area Analysis. MTDT 1999: 48-53

Coauthor Index

1	Sergei Bakarian	[1] [2]
2	Jonathon E. Colburn	[1]
3	Chang Hong	[1]
4	Israel Koren	[3]
5	Madan Kumar	[1]
6	Ron Ross	[2]
7	Alex Shubat	[1]

Colors in the list of coauthors