| |
| 2007 | ||
|---|---|---|
| 3 | EE | Ron Ross: Managing Enterprise Security Risk with NIST Standards. IEEE Computer 40(8): 88-91 (2007) |
| 2001 | ||
| 2 | EE | Ron Ross, Keith McCasland: Early Detection of Design Sensitivities that Cause Yield Loss for New Products. ISQED 2001: 427-430 |
| 1999 | ||
| 1 | EE | Julie D. Segal, Sergei Bakarian, Ron Ross: Impact of Simulation Parameters on Critical Area Analysis. DFT 1999: 14- |
| 1 | Sergei Bakarian | [1] |
| 2 | Keith McCasland | [2] |
| 3 | Julie D. Segal | [1] |