| |
| 2008 | ||
|---|---|---|
| 4 | Udo Schwalke: Novel Field-Effect Controlled Single-Walled Carbon Nanotube Network Devices for Biomedical Sensor Applications. BIODEVICES (2) 2008: 99-102 | |
| 2005 | ||
| 3 | EE | Udo Schwalke, Yordan Stefanov: Process integration and nanometer-scale electrical characterization of crystalline high-k gate dielectrics. Microelectronics Reliability 45(5-6): 790-793 (2005) |
| 2001 | ||
| 2 | EE | Udo Schwalke: Progress in device isolation technology. Microelectronics Reliability 41(4): 483-490 (2001) |
| 1 | EE | Udo Schwalke, Martin Pölzl, Thomas Sekinger, Martin Kerber: Ultra-thick gate oxides: charge generation and its impact on reliability. Microelectronics Reliability 41(7): 1007-1010 (2001) |
| 1 | Martin Kerber | [1] |
| 2 | Martin Pölzl | [1] |
| 3 | Thomas Sekinger | [1] |
| 4 | Yordan Stefanov | [3] |