| |
| 2001 | ||
|---|---|---|
| 2 | EE | Udo Schwalke, Martin Pölzl, Thomas Sekinger, Martin Kerber: Ultra-thick gate oxides: charge generation and its impact on reliability. Microelectronics Reliability 41(7): 1007-1010 (2001) |
| 1 | EE | Gunnar Diestel, Andreas Martin, Martin Kerber, Alfred Schlemm, Horst Erlenmaier, Bernhard Murr, Andreas Preussger: Quality assessment of thin oxides using constant and ramped stress measurements. Microelectronics Reliability 41(7): 1019-1022 (2001) |
| 1 | Gunnar Diestel | [1] |
| 2 | Horst Erlenmaier | [1] |
| 3 | Andreas Martin | [1] |
| 4 | Bernhard Murr | [1] |
| 5 | Martin Pölzl | [2] |
| 6 | Andreas Preussger | [1] |
| 7 | Alfred Schlemm | [1] |
| 8 | Udo Schwalke | [2] |
| 9 | Thomas Sekinger | [2] |