| |
| 2001 | ||
|---|---|---|
| 1 | EE | Udo Schwalke, Martin Pölzl, Thomas Sekinger, Martin Kerber: Ultra-thick gate oxides: charge generation and its impact on reliability. Microelectronics Reliability 41(7): 1007-1010 (2001) |
| 1 | Martin Kerber | [1] |
| 2 | Udo Schwalke | [1] |
| 3 | Thomas Sekinger | [1] |