| |
| 1999 | ||
|---|---|---|
| 2 | EE | Rolf Drechsler, Harry Hengster, Horst Schäfer, Joachim Hartmann, Bernd Becker: Testability of 2-Level AND/EXOR Circuits. J. Electronic Testing 14(3): 219-225 (1999) |
| 1997 | ||
| 1 | EE | Rolf Drechsler, Harry Hengster, Horst Schäfer, Joachim Hartmann, Bernd Becker: Testability of 2-level AND/EXOR circuits. ED&TC 1997: 548-553 |
| 1 | Bernd Becker | [1] [2] |
| 2 | Rolf Drechsler | [1] [2] |
| 3 | Joachim Hartmann | [1] [2] |
| 4 | Harry Hengster | [1] [2] |