| 1999 |
|---|
| 6 | EE | Rolf Drechsler,
Harry Hengster,
Horst Schäfer,
Joachim Hartmann,
Bernd Becker:
Testability of 2-Level AND/EXOR Circuits.
J. Electronic Testing 14(3): 219-225 (1999) |
| 1997 |
|---|
| 5 | EE | Rolf Drechsler,
Harry Hengster,
Horst Schäfer,
Joachim Hartmann,
Bernd Becker:
Testability of 2-level AND/EXOR circuits.
ED&TC 1997: 548-553 |
| 1992 |
|---|
| 4 | | Bernd Becker,
Joachim Hartmann:
Some Remarks on the Test Complexity of Iterative Logic Arrays.
MFCS 1992: 142-152 |
| 1991 |
|---|
| 3 | | Joachim Hartmann:
The Random Testability of the n-Input AND Gate.
STACS 1991: 488-498 |
| 1990 |
|---|
| 2 | EE | Bernd Becker,
Joachim Hartmann:
Optimal-Time Multipliers and C-Testability.
SPAA 1990: 146-154 |
| 1 | | Bernd Becker,
Joachim Hartmann:
Optimal-Time Multipliers and C-Testability.
Elektronische Informationsverarbeitung und Kybernetik 26(10): 547-561 (1990) |
