| 2008 |
|---|
| 4 | EE | A. Tchegho,
Heinz Mattes,
Sebastian Sattler:
Optimal High-Resolution Spectral Analyzer.
DATE 2008: 62-67 |
| 2007 |
|---|
| 3 | EE | Ivo Koren,
Frank Demmerle,
Roland May,
Martin Kaibel,
Sebastian Sattler:
FPGA Architecture for RF Transceiver System and Mixed-Signal Low Cost Tests.
European Test Symposium 2007: 43-48 |
| 2006 |
|---|
| 2 | EE | Heinz Mattes,
Stéphane Kirmser,
Sebastian Sattler:
Next Generation ADC Massive Parallel Testing with Real Time Parameter Evaluation.
J. Electronic Testing 22(4-6): 337-350 (2006) |
| 2004 |
|---|
| 1 | EE | Heinz Mattes,
Claus Dworski,
Sebastian Sattler:
Controlled Sine Wave Fitting for ADC Test.
ITC 2004: 963-971 |
