Stéphane Kirmser
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2006
1
EE
Heinz Mattes
, Stéphane Kirmser,
Sebastian Sattler
: Next Generation ADC Massive Parallel Testing with Real Time Parameter Evaluation.
J. Electronic Testing 22
(4-6): 337-350 (2006)
Coauthor
Index
1
Heinz Mattes
[
1
]
2
Sebastian Sattler
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
