| |
| 2002 | ||
|---|---|---|
| 5 | EE | Ranganathan Sankaralingam, Nur A. Touba: Reducing Test Power During Test Using Programmable Scan Chain Disable. DELTA 2002: 159-166 |
| 4 | EE | Ranganathan Sankaralingam, Nur A. Touba: Inserting Test Points to Control Peak Power During Scan Testing. DFT 2002: 138-146 |
| 3 | EE | Ranganathan Sankaralingam, Nur A. Touba: Controlling Peak Power During Scan Testing. VTS 2002: 153-159 |
| 2001 | ||
| 2 | EE | Ranganathan Sankaralingam, Nur A. Touba, Bahram Pouya: Reducing Power Dissipation during Test Using Scan Chain Disable. VTS 2001: 319-325 |
| 2000 | ||
| 1 | EE | Ranganathan Sankaralingam, Rama Rao Oruganti, Nur A. Touba: Static Compaction Techniques to Control Scan Vector Power Dissipation. VTS 2000: 35-42 |
| 1 | Rama Rao Oruganti | [1] |
| 2 | Bahram Pouya | [2] |
| 3 | Nur A. Touba | [1] [2] [3] [4] [5] |