| |
| 2004 | ||
|---|---|---|
| 2 | EE | A. J. van de Goor, Said Hamdioui, Rob Wadsworth: Detecting Faults in the Peripheral Circuits and an Evaluation of SRAM Tests. ITC 2004: 114-123 |
| 1 | EE | Said Hamdioui, Rob Wadsworth, John Delos Reyes, A. J. van de Goor: Memory Fault Modeling Trends: A Case Study. J. Electronic Testing 20(3): 245-255 (2004) |
| 1 | A. J. van de Goor | [1] [2] |
| 2 | Said Hamdioui | [1] [2] |
| 3 | John Delos Reyes | [1] |