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Rob Wadsworth

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2004
2EEA. J. van de Goor, Said Hamdioui, Rob Wadsworth: Detecting Faults in the Peripheral Circuits and an Evaluation of SRAM Tests. ITC 2004: 114-123
1EESaid Hamdioui, Rob Wadsworth, John Delos Reyes, A. J. van de Goor: Memory Fault Modeling Trends: A Case Study. J. Electronic Testing 20(3): 245-255 (2004)

Coauthor Index

1A. J. van de Goor [1] [2]
2Said Hamdioui [1] [2]
3John Delos Reyes [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)