Jacques Taillefer

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2003

1 EE Meng Lu, Yvon Savaria, Bing Qiu, Jacques Taillefer: IEEE 1149.1 Based Defect and Fault Tolerant Scan Chain for Wafer Scale Integration. DFT 2003: 18-25

2003
1	EE	Meng Lu, Yvon Savaria, Bing Qiu, Jacques Taillefer: IEEE 1149.1 Based Defect and Fault Tolerant Scan Chain for Wafer Scale Integration. DFT 2003: 18-25

Coauthor Index

1 Meng Lu [1]

2 Bing Qiu [1]

3 Yvon Savaria [1]