V. Papez

2006
3	EE	V. Benda, M. Cernik, V. Papez: OCVD carrier lifetime in P+NN+ diode structures with axial carrier lifetime gradient. Microelectronics Journal 37(3): 217-222 (2006)
2	EE	B. Kojecký, V. Papez, D. Sámal: Conditions of temperature and time instability occurrence of reverse-biased semiconductor power devices. Microelectronics Journal 37(3): 269-274 (2006)
2003
1	EE	V. Papez, B. Kojecký, J. Kozísek, J. Hejhal: Transient effects on high voltage diode stack under reverse bias. Microelectronics Reliability 43(4): 557-564 (2003)

Coauthor Index

1	V. Benda	[3]
2	M. Cernik	[3]
3	J. Hejhal	[1]
4	B. Kojecký	[1] [2]
5	J. Kozísek	[1]
6	D. Sámal	[2]

Colors in the list of coauthors