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J. Hejhal

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2003
1EEV. Papez, B. Kojecký, J. Kozísek, J. Hejhal: Transient effects on high voltage diode stack under reverse bias. Microelectronics Reliability 43(4): 557-564 (2003)

Coauthor Index

1B. Kojecký [1]
2J. Kozísek [1]
3V. Papez [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)