| |
| 2006 | ||
|---|---|---|
| 2 | EE | B. Kojecký, V. Papez, D. Sámal: Conditions of temperature and time instability occurrence of reverse-biased semiconductor power devices. Microelectronics Journal 37(3): 269-274 (2006) |
| 2003 | ||
| 1 | EE | V. Papez, B. Kojecký, J. Kozísek, J. Hejhal: Transient effects on high voltage diode stack under reverse bias. Microelectronics Reliability 43(4): 557-564 (2003) |
| 1 | J. Hejhal | [1] |
| 2 | J. Kozísek | [1] |
| 3 | V. Papez | [1] [2] |
| 4 | D. Sámal | [2] |