J. Kozísek
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2003
1
EE
V. Papez
,
B. Kojecký
, J. Kozísek,
J. Hejhal
: Transient effects on high voltage diode stack under reverse bias.
Microelectronics Reliability 43
(4): 557-564 (2003)
Coauthor
Index
1
J. Hejhal
[
1
]
2
B. Kojecký
[
1
]
3
V. Papez
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
