D. Sámal
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2006
1
EE
B. Kojecký
,
V. Papez
, D. Sámal: Conditions of temperature and time instability occurrence of reverse-biased semiconductor power devices.
Microelectronics Journal 37
(3): 269-274 (2006)
Coauthor
Index
1
B. Kojecký
[
1
]
2
V. Papez
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)