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D. Sámal

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2006
1EEB. Kojecký, V. Papez, D. Sámal: Conditions of temperature and time instability occurrence of reverse-biased semiconductor power devices. Microelectronics Journal 37(3): 269-274 (2006)

Coauthor Index

1B. Kojecký [1]
2V. Papez [1]

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