2006 | ||
---|---|---|
2 | EE | Yuqi Wang, K. H. Low, H. L. J. Pang, K. H. Hoon, F. X. Che, Y. S. Yong: Modeling and simulation for a drop-impact analysis of multi-layered printed circuit boards. Microelectronics Reliability 46(2-4): 558-573 (2006) |
2004 | ||
1 | EE | X. Q. Shi, H. L. J. Pang, X. R. Zhang: Investigation of long-term reliability and failure mechanism of solder interconnections with multifunctional micro-moiré interferometry system. Microelectronics Reliability 44(5): 841-852 (2004) |
1 | F. X. Che | [2] |
2 | K. H. Hoon | [2] |
3 | K. H. Low | [2] |
4 | X. Q. Shi | [1] |
5 | Yuqi Wang | [2] |
6 | Y. S. Yong | [2] |
7 | X. R. Zhang | [1] |