F. X. Che

2006
2	EE	Yuqi Wang, K. H. Low, H. L. J. Pang, K. H. Hoon, F. X. Che, Y. S. Yong: Modeling and simulation for a drop-impact analysis of multi-layered printed circuit boards. Microelectronics Reliability 46(2-4): 558-573 (2006)
1	EE	Desmond Y. R. Chong, F. X. Che, John H. L. Pang, Kellin Ng, Jane Y. N. Tan, Patrick T. H. Low: Drop impact reliability testing for lead-free and lead-based soldered IC packages. Microelectronics Reliability 46(7): 1160-1171 (2006)

Coauthor Index

1	Desmond Y. R. Chong	[1]
2	K. H. Hoon	[2]
3	K. H. Low	[2]
4	Patrick T. H. Low	[1]
5	Kellin Ng	[1]
6	H. L. J. Pang	[2]
7	John H. L. Pang	[1]
8	Jane Y. N. Tan	[1]
9	Yuqi Wang	[2]
10	Y. S. Yong	[2]

Colors in the list of coauthors