Takafumi Ohmoto

2001
2	EE	Makoto Nagata, Takafumi Ohmoto, Jin Nagai, Takashi Morie, Atsushi Iwata: Test circuits for substrate noise evaluation in CMOS digital ICs. ASP-DAC 2001: 13-14
1	EE	Yoshitaka Murasaka, Makoto Nagata, Takafumi Ohmoto, Takashi Morie, Atsushi Iwata: Chip-Level Substrate Noise Analysis with Network Reduction by Fundamental Matrix Computation. ISQED 2001: 482-487

Coauthor Index

1	Atsushi Iwata	[1] [2]
2	Takashi Morie	[1] [2]
3	Yoshitaka Murasaka	[1]
4	Jin Nagai	[2]
5	Makoto Nagata	[1] [2]