Jin Nagai

2001
2	EE	Makoto Nagata, Takafumi Ohmoto, Jin Nagai, Takashi Morie, Atsushi Iwata: Test circuits for substrate noise evaluation in CMOS digital ICs. ASP-DAC 2001: 13-14
2000
1	EE	Makoto Nagata, Jin Nagai, Takashi Morie, Atsushi Iwata: Measurements and analyses of substrate noise waveform inmixed-signal IC environment. IEEE Trans. on CAD of Integrated Circuits and Systems 19(6): 671-678 (2000)

Coauthor Index

1	Atsushi Iwata	[1] [2]
2	Takashi Morie	[1] [2]
3	Makoto Nagata	[1] [2]
4	Takafumi Ohmoto	[2]