| |
| 2001 | ||
|---|---|---|
| 2 | EE | Koji Eriguchi, Yoshinao Harada, Masaaki Niwa: Effects of base layer thickness on reliability of CVD Si3N4 stack gate dielectrics. Microelectronics Reliability 41(4): 587-595 (2001) |
| 1999 | ||
| 1 | Shinichi Hirai, Masaaki Niwa, Sadao Kawamura: Development of Impulsive Object Sorting Device with Air Floating. ICRA 1999: 3065- | |
| 1 | Koji Eriguchi | [2] |
| 2 | Yoshinao Harada | [2] |
| 3 | Shinichi Hirai | [1] |
| 4 | Sadao Kawamura | [1] |