2005 |
3 | EE | Hitoshi Iwai,
Atsushi Nakayama,
Naoko Itoga,
Kotaro Omata:
Cantilever Type Probe Card for At-Speed Memory Test on Wafer.
VTS 2005: 85-89 |
2004 |
2 | EE | Osamu Wada,
Toshimasa Namekawa,
Hiroshi Ito,
Atsushi Nakayama,
Shuso Fujii:
Post-Packaging Auto Repair Techniques for Fast Row Cycle Embedded DRAM.
ITC 2004: 1016-1023 |
1 | EE | Hiroki Miura,
Goro Obinata,
Atsushi Nakayama,
K. Hase,
Makoto Sasaki,
Takehiro Iwami,
H. Doki:
Task based approach on trajectory planning with redundant manipulators, and its application to wheelchair propulsion.
RAM 2004: 758-761 |