Naoko Itoga

2005
1	EE	Hitoshi Iwai, Atsushi Nakayama, Naoko Itoga, Kotaro Omata: Cantilever Type Probe Card for At-Speed Memory Test on Wafer. VTS 2005: 85-89

Coauthor Index

1	Hitoshi Iwai	[1]
2	Atsushi Nakayama	[1]
3	Kotaro Omata	[1]