| 2006 |
|---|
| 6 | EE | S. Nakajima,
H. Arimoto,
H. Rensha,
T. Toriu:
Measurement of a Translation and a Rotation of a Tooth after an Orthodontic Treatment Using GA.
ICICIC (1) 2006: 294-297 |
| 2005 |
|---|
| 5 | EE | Y. Saito,
T. Hashinaga,
S. Nakajima:
Effect of CVD-SiO2 film on reliability of GaAs MESFET with Ti/Pt/Au gate metal.
IEEE Transactions on Reliability 54(1): 79-82 (2005) |
| 2004 |
|---|
| 4 | EE | S. Nakajima,
S. Nakamura,
T. Ueki,
T. Sakai:
Sample preparation techniques for physical analysis of VLSIs.
Microelectronics Reliability 44(3): 449-458 (2004) |
| 2002 |
|---|
| 3 | EE | S. Nakajima:
Verification of Web Service Flows with Model-Checking Techniques.
CW 2002: 378-385 |
| 2 | EE | S. Nakajima,
S. Nakamura,
K. Kuji,
T. Ueki,
T. Ajioka,
T. Sakai:
Construction of a cost-effective failure analysis service network--microelectronic failure analysis service in Japan.
Microelectronics Reliability 42(4-5): 511-521 (2002) |
| 1984 |
|---|
| 1 | | T. Hisaki,
S. Okubo,
S. Nakajima,
K. Asatani:
Broadband Communication Network Trial Services in Japan.
ICC (3) 1984: 1405-1408 |
