| |
| 2004 | ||
|---|---|---|
| 2 | EE | S. Nakajima, S. Nakamura, T. Ueki, T. Sakai: Sample preparation techniques for physical analysis of VLSIs. Microelectronics Reliability 44(3): 449-458 (2004) |
| 2002 | ||
| 1 | EE | S. Nakajima, S. Nakamura, K. Kuji, T. Ueki, T. Ajioka, T. Sakai: Construction of a cost-effective failure analysis service network--microelectronic failure analysis service in Japan. Microelectronics Reliability 42(4-5): 511-521 (2002) |
| 1 | T. Ajioka | [1] |
| 2 | K. Kuji | [1] |
| 3 | S. Nakajima | [1] [2] |
| 4 | S. Nakamura | [1] [2] |
| 5 | T. Sakai | [1] [2] |