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K. Kuji

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2002
1EES. Nakajima, S. Nakamura, K. Kuji, T. Ueki, T. Ajioka, T. Sakai: Construction of a cost-effective failure analysis service network--microelectronic failure analysis service in Japan. Microelectronics Reliability 42(4-5): 511-521 (2002)

Coauthor Index

1T. Ajioka [1]
2S. Nakajima [1]
3S. Nakamura [1]
4T. Sakai [1]
5T. Ueki [1]

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