T. Hashinaga
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2005
1
EE
Y. Saito
, T. Hashinaga,
S. Nakajima
: Effect of CVD-SiO
2
film on reliability of GaAs MESFET with Ti/Pt/Au gate metal.
IEEE Transactions on Reliability 54
(1): 79-82 (2005)
Coauthor
Index
1
S. Nakajima
[
1
]
2
Y. Saito
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
