| 1992 |
|---|
| 5 | EE | Miron Abramovici,
Krishna B. Rajan,
David T. Miller:
Freeze!: A New Approach for Testing Sequential Circuits.
DAC 1992: 22-25 |
| 4 | EE | Miron Abramovici,
David T. Miller,
Rabindra K. Roy:
Dynamic redundancy identification in automatic test generation.
IEEE Trans. on CAD of Integrated Circuits and Systems 11(3): 404-407 (1992) |
| 1986 |
|---|
| 3 | | Miron Abramovici,
Premachandran R. Menon,
David T. Miller:
Checkpoint Faults are not Sufficient Target Faults for Test Generation.
IEEE Trans. Computers 35(8): 769-771 (1986) |
| 1985 |
|---|
| 2 | | Miron Abramovici,
James J. Kulikowski,
Premachandran R. Menon,
David T. Miller:
Test Generation In Lamp2: System Overview.
ITC 1985: 45-48 |
| 1 | | Miron Abramovici,
James J. Kulikowski,
Premachandran R. Menon,
David T. Miller:
Test Generation In Lamp2: Concepts and Algorithms.
ITC 1985: 49-56 |
