K. Van de Mieroop

2002
1	EE	Ben Kaczer, Robin Degraeve, M. Rasras, A. De Keersgieter, K. Van de Mieroop, Guido Groeseneken: Analysis and modeling of a digital CMOS circuit operation and reliability after gate oxide breakdown: a case study. Microelectronics Reliability 42(4-5): 555-564 (2002)

Coauthor Index

1	Robin Degraeve	[1]
2	Guido Groeseneken	[1]
3	Ben Kaczer	[1]
4	A. De Keersgieter	[1]
5	M. Rasras	[1]