| |
| 2002 | ||
|---|---|---|
| 1 | EE | Ben Kaczer, Robin Degraeve, M. Rasras, A. De Keersgieter, K. Van de Mieroop, Guido Groeseneken: Analysis and modeling of a digital CMOS circuit operation and reliability after gate oxide breakdown: a case study. Microelectronics Reliability 42(4-5): 555-564 (2002) |
| 1 | Robin Degraeve | [1] |
| 2 | Guido Groeseneken | [1] |
| 3 | Ben Kaczer | [1] |
| 4 | K. Van de Mieroop | [1] |
| 5 | M. Rasras | [1] |