| 2005 |
|---|
| 4 | EE | C. Hartmann,
W. Mertin,
G. Bacher:
Circuit-internal signal measurements with a needle sensor.
Microelectronics Reliability 45(9-11): 1505-1508 (2005) |
| 2003 |
|---|
| 3 | EE | F. Seifert,
R. Weber,
W. Mertin,
E. Kubalek:
A new technique for contactless current contrast imaging of high frequency signals.
Microelectronics Reliability 43(9-11): 1633-1638 (2003) |
| 2002 |
|---|
| 2 | EE | C. Hartmann,
R. Weber,
W. Mertin,
E. Kubalek,
A.-D. Müller,
M. Hietschold:
Simultaneous IC-internal voltage and current measurements via a multi lever Scanning Force Microscope.
Microelectronics Reliability 42(9-11): 1759-1762 (2002) |
| 1998 |
|---|
| 1 | EE | W. Mertin,
Anton Leyk,
Ulf Behnke,
V. Wittpahl:
Contactless gigahertz testing.
ITC 1998: 843- |
