2002 | ||
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2 | EE | A.-D. Müller, F. Müller, J. Middeke, J. Mehner, J. Wibbeler, Th. Gessner, M. Hietschold: Double-cantilever device for Atomic Force Microscopy in dynamic noncontact-mode. Microelectronics Reliability 42(9-11): 1685-1688 (2002) |
1 | EE | C. Hartmann, R. Weber, W. Mertin, E. Kubalek, A.-D. Müller, M. Hietschold: Simultaneous IC-internal voltage and current measurements via a multi lever Scanning Force Microscope. Microelectronics Reliability 42(9-11): 1759-1762 (2002) |
1 | Th. Gessner | [2] |
2 | C. Hartmann | [1] |
3 | M. Hietschold | [1] [2] |
4 | E. Kubalek | [1] |
5 | J. Mehner | [2] |
6 | W. Mertin | [1] |
7 | J. Middeke | [2] |
8 | F. Müller | [2] |
9 | R. Weber | [1] |
10 | J. Wibbeler | [2] |