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A.-D. Müller

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2002
2EEA.-D. Müller, F. Müller, J. Middeke, J. Mehner, J. Wibbeler, Th. Gessner, M. Hietschold: Double-cantilever device for Atomic Force Microscopy in dynamic noncontact-mode. Microelectronics Reliability 42(9-11): 1685-1688 (2002)
1EEC. Hartmann, R. Weber, W. Mertin, E. Kubalek, A.-D. Müller, M. Hietschold: Simultaneous IC-internal voltage and current measurements via a multi lever Scanning Force Microscope. Microelectronics Reliability 42(9-11): 1759-1762 (2002)

Coauthor Index

1Th. Gessner [2]
2C. Hartmann [1]
3M. Hietschold [1] [2]
4E. Kubalek [1]
5J. Mehner [2]
6W. Mertin [1]
7J. Middeke [2]
8F. Müller [2]
9R. Weber [1]
10J. Wibbeler [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)