| |
| 2002 | ||
|---|---|---|
| 2 | EE | A.-D. Müller, F. Müller, J. Middeke, J. Mehner, J. Wibbeler, Th. Gessner, M. Hietschold: Double-cantilever device for Atomic Force Microscopy in dynamic noncontact-mode. Microelectronics Reliability 42(9-11): 1685-1688 (2002) |
| 1 | EE | C. Hartmann, R. Weber, W. Mertin, E. Kubalek, A.-D. Müller, M. Hietschold: Simultaneous IC-internal voltage and current measurements via a multi lever Scanning Force Microscope. Microelectronics Reliability 42(9-11): 1759-1762 (2002) |
| 1 | Th. Gessner | [2] |
| 2 | C. Hartmann | [1] |
| 3 | E. Kubalek | [1] |
| 4 | J. Mehner | [2] |
| 5 | W. Mertin | [1] |
| 6 | J. Middeke | [2] |
| 7 | A.-D. Müller | [1] [2] |
| 8 | F. Müller | [2] |
| 9 | R. Weber | [1] |
| 10 | J. Wibbeler | [2] |