2001 |
7 | | Solomon Max:
Ramp testing of ADC transition levels using finite resolution ramps.
ITC 2001: 495-501 |
1999 |
6 | | Solomon Max:
Testing high speed high accuracy analog to digital converters embedded in systems on a chip.
ITC 1999: 763-771 |
1998 |
5 | EE | Eric Rosenfeld,
Solomon Max:
When "almost" is good enough: a fresh look at DSP clock rates.
ITC 1998: 249-253 |
1996 |
4 | | Solomon Max:
Extending Calibration Intervals.
ITC 1996: 118-126 |
1995 |
3 | | Solomon Max:
Visualizing Quality.
ITC 1995: 87-96 |
1994 |
2 | | Solomon Max:
Ensuring System Traceability to International Standards.
ITC 1994: 471-480 |
1989 |
1 | | Solomon Max:
Fast Accurate and Complete ADC Testing.
ITC 1989: 111-117 |