Y. Mashiko

2001
2	EE	T. Koyama, M. Umeno, K. Sonoda, J. Komori, Y. Mashiko: Locally delineating of junctions and defects by local cross-section electron-beam-induced-current technique. Microelectronics Reliability 41(8): 1243-1253 (2001)
1	EE	M. K. Mazumder, S. Yamamoto, H. Maeda, J. Komori, Y. Mashiko: Mechanism of pre-annealing effect on electromigration immunity of Al-Cu line. Microelectronics Reliability 41(8): 1259-1264 (2001)

Coauthor Index

1	J. Komori	[1] [2]
2	T. Koyama	[2]
3	H. Maeda	[1]
4	M. K. Mazumder	[1]
5	K. Sonoda	[2]
6	M. Umeno	[2]
7	S. Yamamoto	[1]