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| 2001 | ||
|---|---|---|
| 1 | EE | T. Koyama, M. Umeno, K. Sonoda, J. Komori, Y. Mashiko: Locally delineating of junctions and defects by local cross-section electron-beam-induced-current technique. Microelectronics Reliability 41(8): 1243-1253 (2001) |
| 1 | J. Komori | [1] |
| 2 | T. Koyama | [1] |
| 3 | Y. Mashiko | [1] |
| 4 | M. Umeno | [1] |