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M. K. Mazumder

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2001
1EEM. K. Mazumder, S. Yamamoto, H. Maeda, J. Komori, Y. Mashiko: Mechanism of pre-annealing effect on electromigration immunity of Al-Cu line. Microelectronics Reliability 41(8): 1259-1264 (2001)

Coauthor Index

1J. Komori [1]
2H. Maeda [1]
3Y. Mashiko [1]
4S. Yamamoto [1]

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