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Edward W. Y. Liu

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1996
7EEAlper Demir, Edward W. Y. Liu, Alberto L. Sangiovanni-Vincentelli: Time-domain non-Monte Carlo noise simulation for nonlinear dynamic circuits with arbitrary excitations. IEEE Trans. on CAD of Integrated Circuits and Systems 15(5): 493-505 (1996)
1995
6EEEdward W. Y. Liu, Alberto L. Sangiovanni-Vincentelli: Verification of Nyquist data converters using behavioral simulation. IEEE Trans. on CAD of Integrated Circuits and Systems 14(4): 493-502 (1995)
1994
5EEAlper Demir, Edward W. Y. Liu, Alberto L. Sangiovanni-Vincentelli: Time-domain non-Monte Carlo noise simulation for nonlinear dynamic circuits with arbitrary excitations. ICCAD 1994: 598-603
1993
4EEEdward W. Y. Liu, Henry C. Chang, Alberto L. Sangiovanni-Vincentelli: Analog System Verification in the Presence of Parasitics Using Behavioral Simulation. DAC 1993: 159-163
3EEEdward W. Y. Liu, Alberto L. Sangiovanni-Vincentelli: Nyquist data converter testing and yield analysis using behavioral simulation. ICCAD 1993: 341-348
1992
2EEEdward W. Y. Liu, Alberto L. Sangiovanni-Vincentelli: Behavioral simulation for noise in mixed-mode sampled-data systems. ICCAD 1992: 322-326
1991
1 Edward W. Y. Liu, Alberto L. Sangiovanni-Vincentelli, Georges G. E. Gielen, Paul R. Gray: A Behavioral Representation for Nyquist Rate A/D Converters. ICCAD 1991: 386-389

Coauthor Index

1Henry C. Chang [4]
2Alper Demir [5] [7]
3Georges G. E. Gielen [1]
4Paul R. Gray [1]
5Alberto L. Sangiovanni-Vincentelli [1] [2] [3] [4] [5] [6] [7]

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