| 1996 |
|---|
| 7 | EE | Alper Demir,
Edward W. Y. Liu,
Alberto L. Sangiovanni-Vincentelli:
Time-domain non-Monte Carlo noise simulation for nonlinear dynamic circuits with arbitrary excitations.
IEEE Trans. on CAD of Integrated Circuits and Systems 15(5): 493-505 (1996) |
| 1995 |
|---|
| 6 | EE | Edward W. Y. Liu,
Alberto L. Sangiovanni-Vincentelli:
Verification of Nyquist data converters using behavioral simulation.
IEEE Trans. on CAD of Integrated Circuits and Systems 14(4): 493-502 (1995) |
| 1994 |
|---|
| 5 | EE | Alper Demir,
Edward W. Y. Liu,
Alberto L. Sangiovanni-Vincentelli:
Time-domain non-Monte Carlo noise simulation for nonlinear dynamic circuits with arbitrary excitations.
ICCAD 1994: 598-603 |
| 1993 |
|---|
| 4 | EE | Edward W. Y. Liu,
Henry C. Chang,
Alberto L. Sangiovanni-Vincentelli:
Analog System Verification in the Presence of Parasitics Using Behavioral Simulation.
DAC 1993: 159-163 |
| 3 | EE | Edward W. Y. Liu,
Alberto L. Sangiovanni-Vincentelli:
Nyquist data converter testing and yield analysis using behavioral simulation.
ICCAD 1993: 341-348 |
| 1992 |
|---|
| 2 | EE | Edward W. Y. Liu,
Alberto L. Sangiovanni-Vincentelli:
Behavioral simulation for noise in mixed-mode sampled-data systems.
ICCAD 1992: 322-326 |
| 1991 |
|---|
| 1 | | Edward W. Y. Liu,
Alberto L. Sangiovanni-Vincentelli,
Georges G. E. Gielen,
Paul R. Gray:
A Behavioral Representation for Nyquist Rate A/D Converters.
ICCAD 1991: 386-389 |
