| |
| 1994 | ||
|---|---|---|
| 3 | Sen-Pin Lin, Sandeep K. Gupta, Melvin A. Breuer: A Low Cost BIST Methodology and Associated Novel Test Pattern Generator. EDAC-ETC-EUROASIC 1994: 106-112 | |
| 1993 | ||
| 2 | EE | Sen-Pin Lin, Charles Njinda, Melvin A. Breuer: Generating a family of testable designs using the BILBO methodology. J. Electronic Testing 4(1): 71-89 (1993) |
| 1991 | ||
| 1 | Sen-Pin Lin, Charles Njinda, Melvin A. Breuer: A Systematic Approach for Designing Testable VLSI Circuits. ICCAD 1991: 496-499 | |
| 1 | Melvin A. Breuer | [1] [2] [3] |
| 2 | Sandeep K. Gupta | [3] |
| 3 | Charles Njinda | [1] [2] |