| 2006 |
|---|
| 8 | EE | A. S. Oates,
S. C. Lee:
Electromigration failure distributions of dual damascene Cu /low - k interconnects.
Microelectronics Reliability 46(9-11): 1581-1586 (2006) |
| 2001 |
|---|
| 7 | EE | S. C. Hung,
P. J. Zheng,
S. H. Ho,
S. C. Lee,
H. N. Chen,
J. D. Wu:
Board level reliability of PBGA using flex substrate.
Microelectronics Reliability 41(5): 677-687 (2001) |
| 1994 |
|---|
| 6 | | S. C. Lee:
Sensor value validation based on systematic exploration of the sensor redundancy for fault diagnosis KBS.
IEEE Transactions on Systems, Man, and Cybernetics 24(4): 594-605 (1994) |
| 1991 |
|---|
| 5 | | S. C. Lee,
Michelle Ratliff,
Craig Peterson,
Louis F. Lollar:
AMPERES: A real-time fault monitoring and diagnosis knowledge-based system for space power systems.
Applied Artificial Intelligence 5(3): 281-308 (1991) |
| 4 | EE | S. C. Lee,
Soo-Y. Lee:
A Rapid Method for Determining Excited State Surface Parameters and Bond Length in Diatomic Molecules and Calculating Wavefunctions for Franck-Condon Factors Using the Quantum Momentum Method.
Computers & Chemistry 15(3): 215-223 (1991) |
| 1988 |
|---|
| 3 | EE | U. K. Gupta,
S. C. Lee:
A Blackboard Architecture for Problem Solving and Machine Learning in an Expert System for Power System Voltage Control.
IEA/AIE (Vol. 1) 1988: 306-316 |
| 1984 |
|---|
| 2 | EE | C. C. Chen,
K. M. Koh,
S. C. Lee:
On the grading numbers of direct products of chains.
Discrete Mathematics 49(1): 21-26 (1984) |
| 1975 |
|---|
| 1 | | H. Asai,
S. C. Lee:
Design of Queuing Buffer Register Size.
Inf. Process. Lett. 3(5): 147-152 (1975) |
