| 2007 |
|---|
| 8 | EE | Tsung I. Lin,
Jack C. Lee,
Wan J. Hsieh:
Robust mixture modeling using the skew t distribution.
Statistics and Computing 17(2): 81-92 (2007) |
| 2006 |
|---|
| 7 | EE | Tsung I. Lin,
Jack C. Lee,
Hsiu J. Ho:
On fast supervised learning for normal mixture models with missing information.
Pattern Recognition 39(6): 1177-1187 (2006) |
| 2005 |
|---|
| 6 | EE | Se Jong Rhee,
Jack C. Lee:
Threshold voltage instability characteristics of HfO2 dielectrics n-MOSFETs.
Microelectronics Reliability 45(7-8): 1051-1060 (2005) |
| 2004 |
|---|
| 5 | EE | Young-Hee Kim,
Jack C. Lee:
Reliability characteristics of high-k dielectrics.
Microelectronics Reliability 44(2): 183-193 (2004) |
| 4 | EE | Tsung I. Lin,
Jack C. Lee,
Huey F. Ni:
Bayesian analysis of mixture modelling using the multivariate t distribution.
Statistics and Computing 14(2): 119-130 (2004) |
| 2001 |
|---|
| 3 | EE | Fred Mintzer,
Gordon W. Braudaway,
Francis P. Giordano,
Jack C. Lee,
Karen A. Magerlein,
Silvana D'Auria,
Amnon Ribak,
Gil Shapir,
Fabio Schiattarella,
John Tolva,
Andrey Zelenkov:
Populating the Hermitage Museum's new web site.
Commun. ACM 44(8): 52-60 (2001) |
| 1996 |
|---|
| 2 | EE | Frederick C. Mintzer,
Leonard E. Boyle,
Albert N. Cazes,
Brian S. Christian,
Steven C. Cox,
Francis P. Giordano,
Henry M. Gladney,
Jack C. Lee,
Milton L. Kelmanson,
Antonio C. Lirani,
Karen A. Magerlein,
Ana M. B. Pavani,
Fabio Schiattarella:
Toward on-line, worldwide access to Vatican Library materials.
IBM Journal of Research and Development 40(2): 139-162 (1996) |
| 1982 |
|---|
| 1 | | Arnold S. Tran,
Richard A. Forsberg,
Jack C. Lee:
A VLSI Design Verification Strategy.
IBM Journal of Research and Development 26(4): 475-484 (1982) |
