Se Jong Rhee
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2005
1
EE
Se Jong Rhee,
Jack C. Lee
: Threshold voltage instability characteristics of HfO
2
dielectrics n-MOSFETs.
Microelectronics Reliability 45
(7-8): 1051-1060 (2005)
Coauthor
Index
1
Jack C. Lee
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
