| 2001 |
|---|
| 5 | EE | Norio Kuji,
Takako Ishihara:
EB-Testing-Pad Method and Its Evaluation by Actual Devices.
Asian Test Symposium 2001: 179-184 |
| 1997 |
|---|
| 4 | EE | Norio Kuji:
Guided-Probe Diagnosis of Macro-Cell-Designed LSI Circuits.
Asian Test Symposium 1997: 174- |
| 1986 |
|---|
| 3 | | Norio Kuji,
Teruo Tamama:
An Automated F-Beam Tester with CAD Interface, "Finder": A Powerful Tool for Fault Diagnosis of ASICs.
ITC 1986: 857-863 |
| 2 | EE | Norio Kuji,
Teruo Tamama,
M. Nagatani:
FINDER: A CAD System-Based Electron Beam Tester for Fault Diagnosis of VLSI Circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 5(2): 313-319 (1986) |
| 1985 |
|---|
| 1 | | Norio Kuji,
Teruo Tamama:
Automated Fault Diagnostic EB Tester and Its Application to a 40K-Gate VLSI Circuit.
ITC 1985: 643-651 |
