| |
| 2001 | ||
|---|---|---|
| 5 | EE | Norio Kuji, Takako Ishihara: EB-Testing-Pad Method and Its Evaluation by Actual Devices. Asian Test Symposium 2001: 179-184 |
| 1997 | ||
| 4 | EE | Norio Kuji: Guided-Probe Diagnosis of Macro-Cell-Designed LSI Circuits. Asian Test Symposium 1997: 174- |
| 1986 | ||
| 3 | Norio Kuji, Teruo Tamama: An Automated F-Beam Tester with CAD Interface, "Finder": A Powerful Tool for Fault Diagnosis of ASICs. ITC 1986: 857-863 | |
| 2 | EE | Norio Kuji, Teruo Tamama, M. Nagatani: FINDER: A CAD System-Based Electron Beam Tester for Fault Diagnosis of VLSI Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 5(2): 313-319 (1986) |
| 1985 | ||
| 1 | Norio Kuji, Teruo Tamama: Automated Fault Diagnostic EB Tester and Its Application to a 40K-Gate VLSI Circuit. ITC 1985: 643-651 | |
| 1 | Takako Ishihara | [5] |
| 2 | M. Nagatani | [2] |
| 3 | Teruo Tamama | [1] [2] [3] |